14:20 - 15:00
Room: Room3
Invited talk
Chair/s:
Monika Tomar Chowdhuri
(INVITED) High-density ferroelectric random access memory using wall-current readout of binary information
Anquan Jiang 1, Jun Jiang 1, Zilong Bai 1, Cheol Hwang 2, James Scott 3
1 Fudan University, Shanghai, China
2 Seoul National University, Seoul, Korea, Republic of (South)
3 St. Andrews University, St. Andrews, United Kingdom

Ferroelectric polarization can be reversed by mechanical force, thermal heating, electron/light illumination, gas pressure or electrical fields, enabling applications in spatial visualization, electrochemical sensors, and terabit non-volatile ferroelectric memories with ns-to-ps programming times, near-unlimited cycle endurance and low energy consumption. One significant challenge for these applications is the current capacitor-based technology that destructively reads out domain information through charge integration, requiring memory cells with >250 nm lateral sizes, although mechanical probe-based technology has demonstrated huge ferroelectric storage capacity of several Tb/in2. Here we show a nanoscale non-destructive ferroelectric polarization readout method via electrical opening of charged-domain-wall conduction paths near the film surface layer under a horizontal read field. Our method is not only applicable for epitaxial BiFeO3 thin films on (001) SrTiO3 substrates with a diagonal polar axis but also successful for other nonorthogonal ferroelectrics. They have mesa-geometry three-terminal structures and functions via instantaneous domain-wall conduction upon voltage application. The operation principle of newly explored devices combines the merits of non-volatile ferroelectric memory and current-sensing resistance switching memory in ultrahigh storage density.


Reference:
Fr-S100-O-01
Presenter/s:
Anquan Jiang
Presentation type:
Oral communication
Room:
Room3
Chair/s:
Monika Tomar Chowdhuri
Date:
Friday, September 8th, 2017
Time:
14:20 - 14:40
Session times:
14:20 - 15:00