11:30 - 12:30
ORAL SESSION
Room: Room2
Oral presentation
Chair/s:
Rattikorn Yimnirun
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Phase transition behavior and defect chemistry of the BaTi0.94Sn0.06O3 Ceramic investigated via in-situ extended X-ray absorption fine structure technique
Usa Sukkha 1, 3, Narong Chanlek 1, Rattikorn Yimnurun 2, Manoon Sutapun 3, Rangson Muanghlua 4, Naratip Vittayakorn 3, 5, 6, Pinit Kidkhunthod 1
1 Synchrotron Light Research Institute (Public Organization), 111 University Avenue, Muang District, Nakhon Ratchasima, Thailand
2 School of Physics, Institute of Science, and NANOTEC-SUT COE on Advanced Functional Nanomaterials, Suranaree University of Technology, Nakhon Ratchasima, Thailand
3 Advanced Materials Research Unit, Faculty of Science, King Mongkut's Institute of Technology Ladkrabang, Bangkok, Thailand
4 Department of Electronics Engineering, Faculty of Engineering, King Mongkut’s Institute of Technology Ladkrabang, Bangkok, Thailand
5 Department of Chemistry, Faculty of Science, King Mongkut's Institute of Technology Ladkrabang, Bangkok, Thailand
6 Nano-KMITL Center of Excellence on Nanoelectronic Devices, King Mongkut’s Institute of Technology Ladkrabang, Bangkok, Thailand

In this study, ferroelectric phase transitions in BaTi0.94Sn0.06O3 (BTS) ceramic as a function of temperature are characterized with synchrotron X-ray absorption spectroscopy (XAS) technique, dielectric and ferroelectric measurements. Dense BTS ceramic exhibits orthorhombic symmetry confirmed by Rietveld refinement and Raman spectroscopy. The rhombohedral-orthorhombic (R-O), orthorhombic-tetragonal (O-T) and tetragonal-cubic (T-C) ferroelectric phase transitions were clearly observed in the dielectric results. Furthermore, anomalous dielectric relaxation around 90-105 K which far below the R-O phase transition was evidently founded. In order to investigate the local structure, In-situ extended X-ray absorption fine structure (EXAFS) was used especially at the ferroelectric phase transition region. The EXAFS results indicated a change in local structure around the Ti absorbing atom when the temperature increased. Evident of the O-T and T-O phase transitions is clearly seen in EXAFS results. Based on chemical analysis of bulk and surface of BTS ceramic by using X-ray photoelectron spectroscopy (XPS), anomalous dielectric relaxation should be attributed to mixed oxidation states of Sn.

Reference:
Fr-S92-O-02
Presenter/s:
Usa Sukkha
Presentation type:
Oral communication
Room:
Room2
Chair/s:
Rattikorn Yimnirun
Date:
Friday, September 8th, 2017
Time:
11:45 - 12:00
Session times:
11:30 - 12:30
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