09:45 - 11:00
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09:45 - 11:00
Structural defects and impurities in crystalline materials-02, SG-I-2
Room: {session_room}
Chair/s:
Claudio Ferrari, Jean-Pierre Landesman
09:45 - 10:15
Invited talk-01
Methods for Nanoscale Strain and Stress Mapping in Thin Films
Jozef Keckes, Montanuniversität Leoben
{x_abstract}
10:15 - 10:30
Oral presentation-02
Influence of growth process and crystal defects on sapphire brittleness
Thierry Duffar, Grenoble Institute of Technology
{x_abstract}
10:30 - 10:45
Oral presentation-03
Thermal equilibrium point defects in Si
Kentaro Kutsukake, Tohoku University
{x_abstract}
10:45 - 11:00
Oral presentation-04
Methodology of line dislocation density mapping in aluminum bulk crystals using high energy X-ray transmission topography for quality control in crystal growth
Roland Weingärtner, Fraunhofer Institute for Integrated Systems and Device Technology IISB
{x_abstract}