In situ reflection electron microscopy for investigation of surface processes on Bi 2 Se 3 (0001) during adsorption, sublimation, and growth

In situ reflection electron microscopy for investigation of surface processes on Bi₂Se₃(0001) during adsorption, sublimation, and growth

Oral presentation-04

Presented by: Dmitry Rogilo

Dmitry Rogilo

Rzhanov Institute of Semiconductor Physics SB RAS