11:30 - 12:45
Room: SG-II-1
Chair/s:
Jochen Friedrich, Stefano Rampino
X-ray topographic characterization of structural defects in thick epitaxial silicon for solar cells
Oral presentation-03
Presented by: Paul Wimmer
Paul Wimmer
Fraunhofer Institute for Integrated Systems and Device Technology IISB, Department Materials, Schottkystrasse 10, Erlangen, 91058, Germany