ICCGE-20
Browse
Search
Bookmarks
Sun, 30 Jul
Mon, 31 Jul
Tue, 1 Aug
Wed, 2 Aug
Thu, 3 Aug
Fri, 4 Aug
09:45 - 11:00
Advances in observation and characterization methods-01, SG-II-2
Room: SG-II-2
Chair/s:
Cinzia Giannini, Luke Rhodes
‹
Back
Characterization of Defects in SiC Substrates for Power Device Applications by Birefringence Imaging
Oral presentation-02
Presented by: Shunta Harada
Shunta Harada
et al.
Nagoya University
PDF Abstract
Bookmark